Nanometrics NanoSpec AFT 200 Thickness Measurement System

8" Configuration overview: Nanospec/AFT M6099 Filk thick Tool status: offline, broken

Wafer size: 300mm Semiconductor Fabrication Metrology Equipment CD Measurement System

Wafer Size: 300mm Category: Metrology Concentration Process: PL Mapping

Mask & Wafer Inspection 12"

Film thickness measurement 150mm

Ox film thickness measurement 200mm

Process: thickness measurement Wafer size: 12" Condition: as is

Working condition

Sold As Is

Nanometrics 4000 Film Thickness Measurement System Model Number 7200-1821 Rev B 150 mm Wafer Co...

The NanoSpec 6100 is a fast, reliable, low cost tabletop film thickness and mapping system that p...