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Used Rudolph NSX 105

Macro-Defect Metrology Equipment Currently Configured for: 300mm Current Equipment Status: Ava...

Used 2010 Rudolph AXI-940B

Auto Wafer, Die & Bump Inspection

Used 2006 Rudolph WV320

Macro inspection Vintage: 2006

Used 2003 Rudolph AXI-S

Macro inspecting Vintage: 2003

Used Rudolph NSX115

Rudolph NSX115

Used Rudolph MP200XCU

Cu film thickness measurement 200mm

Used Rudolph MP300XCu

Cu Film thickness measurement 300mm

Used Rudolph COMPUTER DUAL PROCESSOR KONTRON

As is, where is

Used 2004 Rudolph AXI-S

Process: Macro Defect Inspection Condition: as is Wafer size: 12"

Used 2009 Rudolph MP3 300XCu

Process: Thickness Measurement Wafer size: 12" Condition: as is

Used Rudolph Meta plus 300 2

Rudolph Meta plus 300 2

Used 2011 RUDOLPH MetaPulse-III 300XCu

2011 RUDOLPH MetaPulse-III 300XCu Metal Thickness WAFER SIZE: 12