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Description - MP200 double path tool - non copper tool; double path tool delay stage; - 6 inch c...

Deinstalled and stored in cleanroom Wafer Scanner System For Post-Fab Inspection And 3-D Bump Me...

RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces....

The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. ...

200mm As-is

200mm As-is

200mm As-is

Condition: “As is” Date of manufacture: 2015 Wafer size 300mm Rudolph Technologies has introduc...

Model: Rudolph AXI-940a (2007 vintage ) Mainbody with Objectives and Illumination sources. E25 ...

1.With no wafer transfer front side. 2. And some tools lose external panels.

Used, looks complete, very clean