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1996 RUDOLPH FE-VII
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1996 RUDOLPH FE-VII Film Thickness WAFER SIZE: 8
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2005 RUDOLPH AXI_S
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2005 RUDOLPH AXI_S Inspection Defect Inspecion(Bump) WAFER SIZE: 12
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RUDOLPH WV320 300mm
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RUDOLPH WV320 Wafer size: 300mm Process: measurement
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Rudolph AXI-S
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Macro Wafer Inspection Wafer size: 12" [As-is] 2x Brooks Loader
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RUDOLPH / AUGUST NSX 105C Defect inspection system
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RUDOLPH / AUGUST WAFER INSPECTION SYSTEM MODEL: NSX-105c VINTAGE: 2006 Automatic Wafer Inspection...
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Rudolph Auto EL Ellipsometer
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Rudolph Auto EL Ellipsometer model 2,4A Deinstalled in the warehouse on pallet. Clean, Powers up ...
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Rudolph 105C Wafer inspection System
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Refurbished to OEM Specs Rudolph/August Wafer Inspection System Model:NSX-105C Vintage:2006 SN:NS...
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RUDOLPH AUTOEL-IV Film Thickness Measurement Tool
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5"
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RUDOLPH FE-IV D Film Thickness Measurement Tool
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150MM
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RUDOLPH METAPULSE 300 300mm
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FILM THICKNESS
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RUDOLPH 3DI 8000 300mm
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C4 BUMP INSPECTION
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Rudolph FE V11D Focus Ellipsometer
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Sold in Operational Condition.
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