9 available Number of Test Heads1 Year of Manufacture1997/ 1998/ 2000 (2)/ 2003 (2)/ 2006/ 2001...

DescriptionTESTER_TERADYNE MICROFLEX_MKZEMFLEX75TESTER_TERADY Year of Manufacture2018 Condition...

CATEGORY:Digital Test Systems Year of Manufacture2017 ConditionGood

Like new condition Configuration (Qty: 1) J750EX-HD 8-Slot System(Qty: 1) PWR COND 1 Module / 3...

J750Ex-HD Tester (like new, 2021 vintage)

3 available LSI / IC Tester

Teradyne J750 Testequipment Year of Manufacture 2013 Condition Very Good Power Requirements 20...

Automated Test Equipment SOC ATE SOC Test System Wafer size: 300mm

Description (3) 805-25-50 HSD200 | (7) 805-002-60 DC30 | (2) 810-503-00 DSP | (1) 805-003-50 Sup...

HSD100*4 DPS*2 CUB*1 Test Head No manipulator Engineering cart Power cabinet

In the clean room as pictured rigging and crating are extra Performance Logs are available afte...