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1996 DNS 80B Coat track
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1996 DNS 80B Coat track Set up for 6" wafers - SC-80BW-AV ADHESION - 3 units HP - 6 units CP-...
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August NSX-95
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Defect Inspection As-is, where-is
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Advantest T5771 ES
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Advantest T5771 ES Flash Memory Tester Flash Memory Tester A low-cost and high-throughput test ...
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Hitachi
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AMAT P5000
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AMAT P5000 8" Ox CVD Alpha Silicon WAFER SIZE: 8"
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2005 Nissin EXCEED2000A
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8" Frame Offline, Broken
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Nanometrics Nanospec/AFT M6100
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8" Configuration overview: Nanospec/AFT M6099 Filk thick Tool status: offline, broken
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1999 KLA AMRAY4200C
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Metrology 8" Inspection system SEM
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2001 Hitachi WA200
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Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope WAFER SIZE: 8"
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Akrion Gamma
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Wafer size: 8" Configuration overview: ST28, PSR, QDR, SD Process overview: solvent Tool statu...
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Carl Zeiss Group Axiotron 300
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Carl Zeiss Group Axiotron 300 Microscope Currently Configured for 300mm wafer size EQUIPMENT D...
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2008 Tokyo Electron Ltd. Telius SP-305 SCCM
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Vintage: 2008 (1) 2007 (1) 2005 (1) 2003 (1) Wafer size: 300mm Asset HDD not included Soft...
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