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3 Axis Robot, Rebuilt PN 001-7600-07 Rebuilt by U.S. Technologies and has not been used since bei...

Projection Micrsoscope

Film Thickness Monitor Ellipsometer

2 available StereoZoom Microsope with GSWH20X/12.5 Eyepieces - Eyepieces Model GSWH20X/12.5 - ...

Wafer Inspection Microscope Manufacturer Olympus Model BH-BHM Microscope Type Upright Microsc...

Newport LASERWELD Series 4000 3-Beam Laser Welding Station LW4500 3 beam Nd-YAG welding workstat...

Profilometer - Date of Mfg: 4/92 - ±10 mm Scan Length - 2 to 250 µm/sec Scan Speed - 50/sec nomi...

CD SEM Measurement Tool - Wafer Size Range Minimum 100 mm Maximum 150 mm Set Size 150 mm - Reso...

Xray System XRAY Wafer Analyzer Power Requirements 240 V 2.5 A 47-63 Hz 1 Phase CE Marked YES

Overlay Metrology / CD Measurement Tool for up to 200mm Wafers - Wafer Size Range Maximum 200 m...

Overlay Metrology Tool Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Si...

Overlay Metrology / CD Measurement Tool for up to 200mm Wafers