1999 Leica IN3000
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Wafer Sizes: 8"/200mm
Wafer defect inspection The Leica INS 3000 is the new defect review and in...
KLA Tencor FLX-2908 Thin Film Stress Measurement System 230v 15A 1Ph 50Hz
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Parts
AXIC 1000 XRF, Metal Thickness measurement tool
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Used, looks complete, very clean wafer size (inch): 4, 6, 8
A&D GR-202 Semi-Micro Analytical Balances
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A&D GR-202 Semi-Micro Analytical Balances
Features
Semi-micro, 0.01 mg readability up to 42 g (...


