1999 Leica INS3000

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Used 1999 Leica INS3000
Wafer defect inspection The Leica INS 3000 is the new defect review and inspection station. The a...

1999 Leica IN3000

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Used 1999 Leica IN3000
Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

1988 KLA-Tencor Surfscan 5000

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Used KLA-Tencor Surfscan 5000
- Model: Surfscan 5000 - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, dete...

2009 KLA-Tencor Candela CS 20 V Defectivity Density Measurement

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Used KLA-Tencor Candela CS 20 V Defectivity Density Measurement
- voltage: 110 VAC - operating system: Windows Pro SP3 2009 Vintage complete and in working co...

Leica LMS IPRO Measurement System

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Used Leica LMS IPRO Measurement System

AXIC 1000 XRF, Metal Thickness measurement tool

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Used AXIC 1000 XRF, Metal Thickness measurement tool
Used, looks complete, very clean wafer size (inch): 4, 6, 8

2008 Ryoka System micromap r5500-m150

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Used 2008 Ryoka System micromap r5500-m150
2008 Ryoka System micromap r5500-m150

A&D GR-202 Semi-Micro Analytical Balances

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Used A&D GR-202 Semi-Micro Analytical Balances
A&D GR-202 Semi-Micro Analytical Balances Features Semi-micro, 0.01 mg readability up to 42 g (...

Nikon MM-60 Microscope

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Used Nikon MM-60 Microscope
attached is the spec sheet below. Please download it for info on these MM60 Microscopes.