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1999 Leica IN3000
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Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...
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1988 KLA-Tencor Surfscan 5000
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- Model: Surfscan 5000 - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, dete...
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2009 KLA-Tencor Candela CS 20 V Defectivity Density Measurement
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- voltage: 110 VAC - operating system: Windows Pro SP3 2009 Vintage complete and in working co...
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Hitachi S 4500 Scanning Electron Microscope (SEM)
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Veeco GXRS System XR X-Ray Thickness & Composition Measurement Tool
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KLA Tencor FLX-2908 Thin Film Stress Measurement System 230v 15A 1Ph 50Hz
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AXIC 1000 XRF, Metal Thickness measurement tool
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Used, looks complete, very clean wafer size (inch): 4, 6, 8
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2008 Ryoka System micromap r5500-m150
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2008 Ryoka System micromap r5500-m150
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A&D GR-202 Semi-Micro Analytical Balances
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A&D GR-202 Semi-Micro Analytical Balances Features Semi-micro, 0.01 mg readability up to 42 g (...
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Nikon MM-60 Microscope
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attached is the spec sheet below. Please download it for info on these MM60 Microscopes.
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