1999 Leica INS3000

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Used 1999 Leica INS3000
Wafer defect inspection The Leica INS 3000 is the new defect review and inspection station. The a...

1999 Leica IN3000

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Used 1999 Leica IN3000
Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

Caltex Systems AMS-845xyz Microscope

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Used Caltex Systems AMS-845xyz Microscope
as is

CMI XRX-X4 X-Ray System

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Used CMI XRX-X4 X-Ray System
System is Being Sold As-Is / Where-Is. Missing Computer & Software.

KLA-TENCOR P-10 (Upgraded to P-15) Surface Profiler

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Used KLA-TENCOR P-10 (Upgraded to P-15) Surface Profiler
- Model: Previously a P-10, upgraded with XP upgrade package to convert to a P-15 - Manual wafer...

1990 KLA-Tencor P-1 Profiler

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Used KLA-Tencor P-1 Profiler
- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm

KLA-TENCOR Surfscan 5500

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Used KLA-TENCOR Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...

1988 KLA-Tencor Surfscan 5000

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Used KLA-Tencor Surfscan 5000
- Model: Surfscan 5000 - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, dete...

2009 KLA-Tencor Candela CS 20 V Defectivity Density Measurement

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Used KLA-Tencor Candela CS 20 V Defectivity Density Measurement
- voltage: 110 VAC - operating system: Windows Pro SP3 2009 Vintage complete and in working co...

Nikon OPTIPHOT-300

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Used Nikon OPTIPHOT-300
12" WAFER AS IS

Hitachi S-6280H

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Used Hitachi S-6280H
AS IS