2008 Ryoka System micromap r5500-m150

Metricon 2010 Prism Coupler 633nm/ 1550nm, Ge detector (1997) Prism coupler for thin film thick...

KLA TENCOR PROMETRIX 2139 This title has been auto generated based on the manufacturer, model, a...

Instron 4465, capacity 1125 lbf (5KN) With wedge action grips, Windows 11 PC and Bluehill Univer...

Xray thickness measurement NOVA, T600, 300mm, Tool ID: KW05

A&D GR-202 Semi-Micro Analytical Balances Features Semi-micro, 0.01 mg readability up to 42 g (...

2004 TEL Formula Nitride WAFER SIZE: 12

Complete Sold As Is

The SEM is vacuumed packed and placed in wooden box. It is complete with the software key. It is ...

1998 Hitachi S-5000H SEM

1995 Hitachi S-5000 SEM

2004 TEL Formula Oxide WAFER SIZE: 12