Wafer defect inspection The Leica INS 3000 is the new defect review and inspection station. The a...

Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

as is

System is Being Sold As-Is / Where-Is. Missing Computer & Software.

- Model: Previously a P-10, upgraded with XP upgrade package to convert to a P-15 - Manual wafer...

- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm

- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...

- Model: Surfscan 5000 - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, dete...

- voltage: 110 VAC - operating system: Windows Pro SP3 2009 Vintage complete and in working co...

12" WAFER AS IS

AS IS