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THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage
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Used, looks complete, very clean
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JEOL JWS-7700 wafer inspection system
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Used WS-75BU, WS-70LCKT/15M
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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2014 HMI eScan 500
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HMI eScan 500, Defect Review, 300mm Tool ID: SEI2703
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2011 KLA AMI2900
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KLA AMI2900, 300mm KLA Advanced Macro Inspection Module Tool ID: AMI2900
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2001 INSTRON 5564
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INSTRON, 5564, Pull Tester Tool ID: MET210Y1
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HSEB Axiospect 301
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HSEB, Axiospect 301, Optical Microscope, 300mm Tool ID: OPI2900
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2005 SARTORIUS LA310S
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SARTORIUS, LA310S Tool ID: IND460
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2015 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103
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2016 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104
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