KLA-Tencor 5300

KLA-Tencor 5300
WAFER SIZE: 200mm

LEICA Microscope INM20

LEICA  Microscope INM20
LEICA Microscope INM20

2004 Nanometrics CALIPER_MOSAIC

2004 Nanometrics  CALIPER_MOSAIC
2004 NANOMETRICS CALIPER_MOSAIC Overlay Measurment WAFER SIZE: 12

1996 HITACHI S-5000

1996 HITACHI S-5000
1996 HITACHI S-5000 Broken-SEM

1995 KLA-Tencor Opti-2600

1995 KLA-Tencor Opti-2600
1995 KLA-TENCOR Opti-2600 Thickness Measurement WAFER SIZE: 8

2004 ADE-KLA-TENCOR FIT 3120

2004 ADE-KLA-TENCOR  FIT 3120
2004 ADE-KLA-TENCOR FIT 3120 Particle Counter WAFER SIZE: 12

2007 KLA-Tencor VISEDGE_CV300

2007 KLA-Tencor VISEDGE_CV300
2007 KLA-TENCOR VISEDGE_CV300 Wafer-Edge Inspection WAFER SIZE: 12

1997 KLA-TENCOR AIT-1

1997 KLA-TENCOR  AIT-1
1997 KLA-TENCOR AIT-1 Defect Inspection WAFER SIZE: 8

1996 RUDOLPH FE-VII

1996 RUDOLPH  FE-VII
1996 RUDOLPH FE-VII Film Thickness WAFER SIZE: 8

2000 RUDOLPH MetaPulse-200

2000 RUDOLPH MetaPulse-200
2000 RUDOLPH MetaPulse-200 Metal Thickness WAFER SIZE: 8

2011 RUDOLPH MetaPulse-III 300XCu

2011 RUDOLPH   MetaPulse-III 300XCu
2011 RUDOLPH MetaPulse-III 300XCu Metal Thickness WAFER SIZE: 12

2000 Hitachi S-4700

2000 Hitachi S-4700
2000 Hitachi S-4700 SEM Operational WAFER SIZE: 8