Metrology for sale at Tara Semiconductor Technology

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Used NIKON INM20 inspection Microscope 200mm

LEICA INM20 Wafer Inspection Microscope · Bright/Darkfield Objective Lenses; Plan 5X, Plan Fluor...

Used 2001 INSTRON 5564

INSTRON, 5564 Pull Tester

Used OLYMPUS M Plan 100 / 0.80 ELWD Microscope objective lens

Used Suss PM5 manual prober with Mitutoyo FS60 microscope and (2) PH500 micropositioners, 150mm vacuum chuck

6" vacuum chuck Pair PH500 micropositioners with vacuum base Optional Kinetic Vibration isolati...

Used 1995 Hitachi S-4500

As-is

Used Semiconductor Diagnostics SDI 210 210E-SPV, FAaST, Wafer Measurement

Used, looks complete, very clean

Used SARTORIUS LA310S

SARTORIUS, LA310S

Used Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer

Used, Selling As IS Angstrom SE200BM Spectroscopic Ellipsometer Angstrom AST-DHLS-60-9 ASTBenc...

Used THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage

Used, looks complete, very clean

Used JEOL JWS-7700 wafer inspection system

Used WS-75BU, WS-70LCKT/15M

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester