12" WAFER AS IS

AS IS

Bruker AXS, D8S - 2DB10, Tool ID: XRD300

KEITHLEY, S600, 25 pin kerf tester, Tool ID: KDC1

KEITHLEY, S475, Kerf Parametric Tester,  Tool ID: K273

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K268

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K264

HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle Tool ID: SEI24000

- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot

Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

System is Being Sold As-Is / Where-Is. Missing Computer & Software.