HITACHI CG4100

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Used HITACHI CG4100
HITACHI CG4100, 300mm Tool ID: KA41

1990 KLA-Tencor P-1 Profiler

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Used KLA-Tencor P-1 Profiler
- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot

KLA-TENCOR P-10 (Upgraded to P-15) Surface Profiler

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Used KLA-TENCOR P-10 (Upgraded to P-15) Surface Profiler
- Model: Previously a P-10, upgraded with XP upgrade package to convert to a P-15 - Manual wafer...

THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage

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Used THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage
Used, looks complete, very clean

1999 Leica IN3000

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Used 1999 Leica IN3000
Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

CMI XRX-X4 X-Ray System

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Used CMI XRX-X4 X-Ray System
System is Being Sold As-Is / Where-Is. Missing Computer & Software.

KLA-TENCOR Surfscan 5500

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Used KLA-TENCOR Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...

2009 KLA-Tencor Candela CS 20 V Defectivity Density Measurement

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Used KLA-Tencor Candela CS 20 V Defectivity Density Measurement
- voltage: 110 VAC - operating system: Windows Pro SP3 2009 Vintage complete and in working co...

Zygo KMS 450i Mask Inspection tool

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Used Zygo KMS 450i Mask Inspection tool