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KLA Tencor FLX-2908 Thin Film Stress Measurement System 230v 15A 1Ph 50Hz
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Jandel RM 3000 Four Point Probe
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Used, looks complete, very clean
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AXIC 1000 XRF, Metal Thickness measurement tool
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Used, looks complete, very clean wafer size (inch): 4, 6, 8
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Angstrom Sun Technologies Transmission
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Spectroscopic Ellipsometer Solar Cell Used, looks complete, very clean
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Four Dimension 4 point Prober
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wafer size (inch): 6, 8 Used, looks complete, very clean
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A&D GR-202 Semi-Micro Analytical Balances
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A&D GR-202 Semi-Micro Analytical Balances Features Semi-micro, 0.01 mg readability up to 42 g (...
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2004 TEL Formula Nitride
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2004 TEL Formula Nitride WAFER SIZE: 12
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Nikon NWL 641 Wafer Loader 150mm
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Complete Sold As Is
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1998 Hitachi S-5000H
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1998 Hitachi S-5000H SEM
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1995 Hitachi S-5000
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1995 Hitachi S-5000 SEM
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2004 TEL Formula Oxide
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2004 TEL Formula Oxide WAFER SIZE: 12
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LEICA Microscope INM20
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LEICA Microscope INM20
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