CD SEM Measurement Tool

UV Film Thickness Tool, for up to 200mm Wafers

Profilometer

Xray System

Stainless Steel Dessicator Box 11.5"(w)x10"(d)x12"(h), 5ea Available

Overlay Metroloty / CD Measurement Tool for up to 200mm Wafers

Overlay Metrology / CD Measurement Tool for up to 200mm Wafers, 2ea Available

Still installed in Fab

Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoload...

Overlay Metrology Tool

Overlay Metrology Tool

Overlay Metrology Tool, 2ea Available