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FEI Philips XL-30 Field Emission ESEM
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Used
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Disco DAD320
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Dicing saws, used for 6" wafer Used
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Disco 651
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Dicing Tool Used
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Plasmalab uP Plasma Chamber, ENI ACG-5, Pfeiffer TPH330U, TCP 310
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2007 Nanometrics Vertex Photoluminescence Measuring Device
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- Gratings: 150g-1250 300g-762 600g-400 - Detectors: CCD (512 pixels) InGaAs (256) pixels - Laser...
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Hitachi S-800 Scanning Electron Microscope
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Hitachi S-800 Scanning Electron Microscope, Anelva 956-7152, Daia DPF-4Z Parts
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FilmTek SCI 4000 Wafer Thickness and RI measurement Tool
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MRL Horizontal furnace Model 1148 G2
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4 stack Auto loader Used
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PentaMaster PM1800 High Power LED Tester
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Miscellaneous Chillers
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Make/ model in images 88 available
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2000 NIKON NSR-2205EX14C
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200mm Fab Section Lithography Software Version MCSV E3.42, OCSV E3.42, CIM SECS Process Litho...
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Hitachi S-4800 II Stage System
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▪ SPEC . Windows 2000 . Cold FE type . Type II stage system (fully motorized system) . Vintag...
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