FEI Nova NanoSEM 450 SEM

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Used FEI  Nova NanoSEM 450 SEM
Type: SEM Wafer Size: Equipment Configuration: - 1-30 kV (500 volts possible); 50 volts possibl...

Four Dimensions, Inc. 280I Four Point Probe Meter

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Used Four Dimensions, Inc. 280I Four Point Probe Meter
Four Dimensions 280I Automatic Four Point Probe Meter 120V, 60Hz. Includes PC & monitor. 20in...

2005 LAM Rainbow TCP 9600SE II standalone with DSQ - 150mm Plasma Etch

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Used 2005 LAM Rainbow TCP 9600SE II standalone with DSQ - 150mm Plasma Etch
LAM Rainbow TCP 9600SE II standalone with DSQ - Plasma Etch Vintage: 2005+/-5j Wafersize: 150mm...

ASML Reticle Set

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Used ASML Reticle Set
Reticle Name Reticle Code BA-COMBI-4X 45440204D074 BA-RASTER 45560792P082 BA-SET-UP-IMAGIN 455...

2005 KOLB PS 04 AR CLEANING SYSTEM PCB cleaning

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Used 2005 KOLB PS 04 AR CLEANING SYSTEM PCB cleaning
kolb one-chamber cleaning system PS 04 AR cleaning of soldercarrier, assemblies, ESD boxes, PCB ...

1998 IWATSU ST-0505 Thickness meter

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Used 1998 IWATSU ST-0505 Thickness meter
The Iwatsu ST-0505 is a high-precision test instrument used primarily in the semiconductor and el...

Yield Engineering YES-450PB6 Polyimide Bake Oven

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Used Yield Engineering YES-450PB6 Polyimide Bake Oven
150mm Refurbished

Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers

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Used Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers
Xray Fluorescence Metrology Tool for up to 200mm Wafers

Philips PW-2830 XRF Wafer Analyzer

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Used Philips PW-2830 XRF Wafer Analyzer
PW 2830 is an x-ray system that is widely used in industrial applications to detect faults and de...

KLA-TENCOR Surfscan 6420

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Used KLA-TENCOR Surfscan 6420
Surface Inspection System

2012 ULVAC ENTRON-EX W300

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Used 2012 ULVAC ENTRON-EX W300
Vintage 2012 Wafer size: 300mm . Load Module - Load Port - Robot Arm . Transfer Module - Ro...

TSK Surfcom 590A Wafer surface measurement system

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Used TSK Surfcom 590A Wafer surface measurement system
TSK Surfcom 590A is a highly advanced wafer testing and metrology equipment used for the evaluati...