KLA-TENCOR ASET-F5x Thin Film Measurement System - Manufactured in June, 2002 - Inspection Modes...

KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports - Analysis of 190nm-...

KLA Altair 8935-FFC AOI Tool - For 200mm Patterned Wafers on Film Frames - Brightfield/Darkfield...

Category: ETC Maker: TSK Model: A-PM-88A Wafer Size: 200 Process: Prober

Date of Manufacture: 2023-06-07 Currently Configured for: 200mm Never open to install and never...

1,westbond 7700D ----------1SET 2,MICROSCOPE sz51--1set 3,arm support for the Micscope --1set ...

Good condition Complete with Microscope SZ50 Including heated work holder

Category: Metrology Maker: Leica Model: MIS-200 Wafer Size: 200 Process: Review Inspection C...

Atomic Force Microscope (AFM) An Atomic Force Microscope (AFM) measures topography, feature size...

Tel WDF 8DP Frame Prober Fully Automatic Frame Prober (Wafers & Frames) // with special light sh...

The Megasonic Stainless Steel Cleaning System by PCT Systems is a high-quality unit designed by M...