Specifications Specification Unit DFP8140 Supported workpiece size - Φ4/5/6/8 inch(Select one s...

- Single Phase - 50/60 Hz - 100V 2011 Vintage

Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field...

Complete system except the HDD but if you want the HDD, it can be supplied with additional cost. ...

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV...

Warehoused It was in Working Condition before buying it. No EDX Vintage : 2000. It's complete...

Hitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, re...

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-300...

Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.3nm (1kV, WD=1.5mm, Deceleration mo...

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...

- Ultra high resolution

Wafer size : 12 inch Resolution : ≦2nm Static measurement repeatability(3σ) : 0.6nm Dynamic me...