KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes - For 150m...

3" Wafer Locator Rings for Flexus 2320 Like New

12" Inspection/ measurement

3 available Vintage:2010 (x3) Tool Status Disconnected Wafer Size 300 mm Fab Section Metrolog...

Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology Model EDR 5200 Vintage 2008 ...

Vintage: 2006 Process: Inspection tool Tool status: Disconnected Software version: Windows CI...

- Windows 98 SE - Software Version 4.2 - Previously refurbished in 2016 - Laser replaced in Ma...

KLA Tencor 5200, 200mm

Still Installed in a fab. Working Condition. Wafer : 8 Inches. Vintage : 2014. It’s complete ...

Surface Inspection System

KLA / TENCOR / SM 300 is a wafer testing and metrology equipment that performs a range of functio...

Configuration: 8" setup CD SEM