Metrology - Inspection for sale at Tara Semiconductor Technology

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Used OLYMPUS M Plan 100 / 0.80 ELWD Microscope objective lens

Used JEOL JWS-7700 wafer inspection system

Used WS-75BU, WS-70LCKT/15M

Used 1999 Leica IN3000

Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

Used KLA-TENCOR Surfscan 5500

- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...

Used Hitachi S 4500 Scanning Electron Microscope (SEM)

Used Technical Instruments AMS 310 Mask Inspection tool

Used, looks complete, very clean

Used Nikon NWL 641 Wafer Loader 150mm

Complete Sold As Is

Used 2004 ADE-KLA-TENCOR FIT 3120

2004 ADE-KLA-TENCOR FIT 3120 Particle Counter WAFER SIZE: 12

Used 2007 KLA-Tencor VISEDGE_CV300

2007 KLA-TENCOR VISEDGE_CV300 Wafer-Edge Inspection WAFER SIZE: 12