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JEOL JWS-7700 wafer inspection system
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Used WS-75BU, WS-70LCKT/15M
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1999 Leica IN3000
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Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...
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KLA-TENCOR Surfscan 5500
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- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...
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Hitachi S 4500 Scanning Electron Microscope (SEM)
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Technical Instruments AMS 310 Mask Inspection tool
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Used, looks complete, very clean
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Nikon NWL 641 Wafer Loader 150mm
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Complete Sold As Is
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2004 ADE-KLA-TENCOR FIT 3120
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2004 ADE-KLA-TENCOR FIT 3120 Particle Counter WAFER SIZE: 12
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2007 KLA-Tencor VISEDGE_CV300
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2007 KLA-TENCOR VISEDGE_CV300 Wafer-Edge Inspection WAFER SIZE: 12
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2004 Nanometrics CALIPER_MOSAIC
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2004 NANOMETRICS CALIPER_MOSAIC Overlay Measurment WAFER SIZE: 12
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