Semiconductor Test - ATE for sale at Tara Semiconductor Technology

Used Teradyne J750

In the clean room as pictured rigging and crating are extra Performance Logs are available afte...

Used 2000 Advantest T5371

Advantest T5371 Memory Tester EQUIPMENT DETAILS: Tool Status: Powered down. Configuration. Aud...

Used AGILENT 16702A

AGILENT 16702A Wafer size: 200mm Process: ATE

Used ADVANTEST T5585

ADVANTEST T5585 Wafer size: 200mm Please download the PDF file below for pictures: Advantest T55...

Used ADVANTEST T5382A1

ADVANTEST T5382A1 Wafer size: 200mm Process: ATE

Used ADVANTEST M6751AD

ADVANTEST M6751AD Wafer size: 200mm Process: ATE

Used ADVANTEST M6541AD

ADVANTEST M6541AD Wafer size: 200MM

Used Credence QUARTET1

192 channels Test Download the Spec sheet below: Credence Quartet One SPEC Sheet

Used Credence KALOS HEX

8 sites, 48 I/O per site 8"

Used Credence KALOS HEX

8 sites, 48 I/O per site 8"

Used TERADYNE A580

unix, Mix signal 8" Test

Used LTX Trillium Deltamaster

256 pin, 2 Meg DPMY, 8"