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Hitachi S-4700-II
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Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configu...
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Hitachi S-4700-I w/EDX
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Status of Equipment: Crated Specification: Secondary electron image resolution: 2.1nm at 1kV 1...
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Hitachi S-4800-II
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Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Spec...
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2015 Hitachi Brightfield-Darkfield STEM detectors from Hitachi Regulus SU-8XXX
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Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2015 Status of Equipment: De-install...
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2018 THERMOFISHER FEI Apreo C LoVac
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Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2018 Equipment Information: Apreo C...
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2008 DNS SU-3100
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Process Type: Wet Processing Wafer Size: 300mm Date of Manufacture: 2008 System Power Rating: ...
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2008 ReVera/ VeraFlex VeraFlex
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Process Type: Metrology & Inspection Wafer Size: 300mm Date of Manufacture: 2008 Status of Equ...
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KLA Aleris 8350
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Aleris 8350 300mm
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Rigaku TXRF V300 with VDP
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Process Type: TXRF De-installed
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SEZ 323 (300 or 200mm)
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Process Type: Wet Processing Wafer Size: 200 and 300mm configurable Status of Equipment: De-ins...
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SEZ DV34
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Process Type: Wet Processing Wafer Size: 300mm Status of Equipment: Refurbished SEZ DV34, only...
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KLA HRP240 High Resolution Profiler
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Process Type: Metrology & Inspection Status of Equipment: De-installed
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