CVD System, 12” <45nm process Vintage 2010 2 Chambers: CVD & ALD Process: NiOx, HfOx Trias clu...

Tool Status Connected Wafer Size 300 mm Fab Section Clean Asset Description Resist Strip Tool ...

Tool Status Disconnected Wafer Size NA Fab Section CMP Asset Description SLURRY METROLOGY SYST...

Tool Status Disconnected Wafer Size NA Fab Section CMP Asset Description SLURRY METROLOGY SYST...

Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology Asset Description Darkfeld Wa...

Chiron XACT830A package-level reliability tester, oven-based reliability test system for packaged...

Working condition This machine has been 8 inches installed

As is Images in PDF attached

See configuration in images As is

- Part No: SD 4003 - Model No: SD 4000 - Configured for wafers up to 200mm - SD Version: 6.25A - ...

This Nikon 4S066-017-1 is used working surplus. The physical condition is good, but there are sig...

This Nikon 4S066-020-1 is used working surplus. The physical condition is good, but there are sig...