2005 LAM Rainbow TCP 9600SE II standalone with DSQ - 150mm Plasma Etch

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Used 2005 LAM Rainbow TCP 9600SE II standalone with DSQ - 150mm Plasma Etch
LAM Rainbow TCP 9600SE II standalone with DSQ - Plasma Etch Vintage: 2005+/-5j Wafersize: 150mm...

ASML Reticle Set

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Used ASML Reticle Set
Reticle Name Reticle Code BA-COMBI-4X 45440204D074 BA-RASTER 45560792P082 BA-SET-UP-IMAGIN 455...

2005 KOLB PS 04 AR CLEANING SYSTEM PCB cleaning

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Used 2005 KOLB PS 04 AR CLEANING SYSTEM PCB cleaning
kolb one-chamber cleaning system PS 04 AR cleaning of soldercarrier, assemblies, ESD boxes, PCB ...

1998 IWATSU ST-0505 Thickness meter

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Used 1998 IWATSU ST-0505 Thickness meter
The Iwatsu ST-0505 is a high-precision test instrument used primarily in the semiconductor and el...

Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers

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Used Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers
Xray Fluorescence Metrology Tool for up to 200mm Wafers

2012 ULVAC ENTRON-EX W300

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Used 2012 ULVAC ENTRON-EX W300
Vintage 2012 Wafer size: 300mm . Load Module - Load Port - Robot Arm . Transfer Module - Ro...

2015 BESI Datacon 2200 EVO

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Used 2015 BESI Datacon 2200 EVO

TSK Surfcom 590A Wafer surface measurement system

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Used TSK Surfcom 590A Wafer surface measurement system
TSK Surfcom 590A is a highly advanced wafer testing and metrology equipment used for the evaluati...

Olympus TH3 Inspection Microscope

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Used Olympus TH3 Inspection Microscope
Olympus TH3 Polish Inspection Microscope, w/ WHK10x/20L eyepieces; objectives (1ea): ULWD NeoSPla...

Beckman DU650i Spectrophotometer with monitor

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Used Beckman DU650i Spectrophotometer with monitor
Beckman UV/VIS-Spectrometer DU 650 series The DU® Series 650 Spectrophotometer is a microprocess...

Multi Dessicator

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Used Multi Dessicator
A Multi Desiccator is a device used for storing and preserving moisture-sensitive materials. It t...

DESPATCH LCC1-87N-2

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Used DESPATCH LCC1-87N-2
Special Features The removable HEPA (High Efficiency Particulate Air) filter is designed to prov...