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NANOMETRICS Nano 8000X
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As is 6" The tool is now configured for 8’’wafer for most of Ox films and photo resister film. ...
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2012 Nanometrics UNIFIRE 7900-L
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Tool Status Connected Wafer Size 300 mm Fab Section Metrology Asset Description ICD2900-T ICD2...
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Nanometrics NanoSpec 8300X Film Thickness Analyzer Wafer
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NanoSpec 8300X Film Thickness Analyzer, Wafer Condition: For parts or not working Contents: N...
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Nanometrics Nanospec AFT2100 Film Thickness Measurement System
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film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x...
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Nanometrics EFEM module
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Nanometrics EFM with Brooks robot Note: Three unit load port not included....Already sold.
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Nanometrics 50-2 CD Measurement System, 3" to 6" Wafers, 10x Eyepieces – 5x, 10x, 40x Objectives, Includes Nanoline Computer Controller, Monitor, Keyboard
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Used, complete, very clean Wafer size (inch): 3, 4, 5, 6
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2003 Nanometrics 9100
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This tool missing parts：Main Computer missing. The other no missing.
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Nanometrics NanoSpec AFT 200 Thickness Measurement System
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Nanometrics NanoSpec AFT 200 Thickness Measurement System
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Nanometrics Nanospec/AFT M6100
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8" Configuration overview: Nanospec/AFT M6099 Filk thick Tool status: offline, broken
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Nanometrics 9010 Lithos
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Wafer size: 300mm Semiconductor Fabrication Metrology Equipment CD Measurement System
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2002 Nanometrics SIPHER
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Wafer Size: 300mm Category: Metrology Concentration Process: PL Mapping
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2008 NANOMETRICS 9010
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Mask & Wafer Inspection 12"
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