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Nanometrics ECV Pro UV Electrochemical CV Profiler
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Nanometrics ECVPro Carrier Concentration Profiler - For Si, SiC, II-VI, III-V & III-Nitrides - H...
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Nanometrics 8300XSE
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Nanometrics 8300XSE Film Thickness Analyzer - J.A. Woollam M-44 Spectroscopic Ellipsometer - J.A...
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Nanometrics M5100
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8" Inspection/ measurement
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Nanometrics 9010b Integrated Metrology System
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Height Mtrs 1.42 Mtrs Width Mtrs .66 Mtrs Depth Mtrs .64 Mtrs Shipping Volume M³ .60 M³ G...
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NANOMETRICS EFEM module of Caliper Mosaic
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Nanometrics 8300 XSE
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Nanometrics 8300 XSE for 150/200/300 mm
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2000 Nanometrics Nanospec 8000
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Metrology 8" Frame Thickness measurement 2000 Broken
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Nanometrics NanoSpec 8300X Film Thickness Analyzer Wafer
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NanoSpec 8300X Film Thickness Analyzer, Wafer Condition: For parts or not working Contents: N...
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2007 Nanometrics Vertex Photoluminescence Measuring Device
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- Gratings: 150g-1250 300g-762 600g-400 - Detectors: CCD (512 pixels) InGaAs (256) pixels - Laser...
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2012 Nanometrics UNIFIRE 7900-L
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Tool Status Connected Wafer Size 300 mm Fab Section Metrology Asset Description ICD2900-T ICD2...
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NANOMETRICS Nano 8000X
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As is 6" The tool is now configured for 8’’wafer for most of Ox films and photo resister film. ...
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Nanometrics Nanospec AFT2100 Film Thickness Measurement System
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film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x...
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