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Special Features The removable HEPA (High Efficiency Particulate Air) filter is designed to prov...

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...

BSA 350W lamp 2, 4, & 6 in substrate with 5 & 7 inch mask holder. Fully operational.

JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical ...

The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. ...

This machine is specifically designed to ensure that your markings meet every quality assurance r...

Operational in a fab

Polisher

RTP

DEP

E2 Mainframe, ALD Dep

WSIN + XLRW + OTS + TD, CU