2010 Oxford Instruments X-Strata980

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Used 2010 Oxford Instruments	 X-Strata980
Oxford Instruments X-Strata980 X-ray Fluorescence Spectrometer MFG Date: 2010 EQUIPMENT DETAIL...

2000 ESCO LTD. EMD-WA1000S

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Used 2000 ESCO LTD. EMD-WA1000S
ESCO Ltd. EMD-WA1000S Temperature Desorption Analyzer Currently Configured for 200mm wafer size...

2007 Applied Materials Uvision 200

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Used 2007 Applied Materials Uvision 200
Applied Materials Uvision 200 Brightfield Inspection Currently Configured for 300mm wafer size ...

Nikon OPTISTATION V

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Used Nikon OPTISTATION V
Nikon OPTISTATION V Optical Review System Currently Configured for 200mm wafer size ※ Inspect ...

JEOL JWS-7555

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Used JEOL	 JWS-7555
JEOL JWS-7555 SEM - Defect Review (DR) Currently Configured for 200mm wafer size MFG Date: TBC...

Carl Zeiss Group Axiotron 300

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Used Carl Zeiss Group	 Axiotron 300
Carl Zeiss Group Axiotron 300 Microscope Currently Configured for 300mm wafer size EQUIPMENT D...

2005 KLA-Tencor Corp. SpectraCD 100

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Used 2005 KLA-Tencor Corp. SpectraCD 100
KLA-Tencor Corp. SpectraCD 100 Film Thickness Measurement System Currently Configured for 300mm...

GS Industry Parts Cleaner (Organic)

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Used GS Industry	 Parts Cleaner (Organic)
GS Industry Parts Cleaner (Organic) Parts Cleaner/Dryer EQUIPMENT DETAILS: Organic Cleaner - D...

Nikon OPTISTATION 3100

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Used Nikon OPTISTATION 3100
OPTISTATION 3100 Nikon Optical Review System Metrology Equipment

Nikon AMI-3000

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Used Nikon AMI-3000
AMI-3000 Nikon Macro-Defect Metrology Equipment

Standard Research Systems SR560 — Low-noise voltage preamplifier

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Used Standard Research Systems 	SR560 — Low-noise voltage preamplifier
SR560 — Low-noise voltage preamplifier Standard Research Systems Parts/Peripherals Support Equ...

Edwards GX600N

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Used Edwards GX600N
Edwards GX600N Dry Pump Currently Configured for 300mm wafer size WAFER SIZE: 300mm