TBA - Other TBA for sale at Tara Semiconductor Technology — Page 496

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Used 2009 SEMILAB WT-2000PVN

Process: lifetime measurement Condition: complete

Used BMR HiEtch-LX200

Process: ICP etcher Wafer size: 12" Condition: as is

Used 1999 Tel ACT 8

Wafer size; 8" Process: track Condition: part tool

Used 2002 DNS 80B

Condition: as is Wafer size: 8" Process: track

Used AMAT P5000

Process: Preclean Etchx1, Oxide CVD x2 Condition: as is Wafer size: 8"

Used ASML Yieldstar-S1250

Process: Overlay Measurement Condition: as is Wafer size: 12"

Used 2004 Rudolph AXI-S

Process: Macro Defect Inspection Condition: as is Wafer size: 12"

Used 2009 Rudolph MP3 300XCu

Process: Thickness Measurement Wafer size: 12" Condition: as is

Used 2011 Camtek AIM1 (Xact200)

Process: analyzing Condition: as is

Used Seiko NS 7000 Handler

Vintage: 2007 (see images for specs)

Used 2008 Nanometrics 9010 (Mask & Wafer Inspection)

Working condition

Used 2015 Olympus MK61-F Metallurgical Microscope

Eye Piece: SWH10 x /26.5 Objective lens: MpanFLN x5 x10 x20 Working Condition