Featured
2004 Semitool SST-C-642-250
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Can be sold As Is or can be configured to meet your requirements
Batch Wafer Processing
Etch/Cl...
Featured
2010 Agilent 7500A ICP-MS
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Agilent7500a ICP-MS
CONFIGURATION DETAILS:
7500a ICP-MS
7500 ICP-MSChemstation（Ver. B.02.01）
...
Featured
1996 HITACHI S-3200N SEM with Oxford INCAx-act Detector
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Complete S-3200N SEM with Oxford INCAx-act Detector
Oxford INCAx-act Detector
Vintage 2009
Res...
1996 NIKON NSR-2205i12D
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Tool Status Connected
Wafer Size 200 mm
Fab Section Lithography
Vintage 1996
Asset Descriptio...
1996 NIKON 2205i11D
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Tool Status Running Wafers
Wafer Size 200 mm
Fab Section Lithography
Vintage 1996
Asset Descr...
2006 KLA Surfscan SP2
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Wafer Defect Inspection System
Wafer Size300mm
Vintage May. 2006
Windows System
Main S/W
Waf...
2015 Bruker Scion GCMS Triple Quad Systems
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GC 436 , Scion Triple quad mass spectrometer, autosampler, pc and pump included
2017 Beneq TFS 200
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ALD (Atomic Layer Deposition)
Deposition Equipment
Date of Manufacture: 2017-01-01
Currently C...
2006 ASML PAS 5500/1150 C Wafer Stepper
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Year of Manufacture2006
ConditionUsed/See Description
ASML PAS 5500/1150 C Wafer Stepper, NC# 9...
2009 Oxford Plasmalab 100 PECVD System
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Advanced PECVD system for thin film deposition and etch applications
Key Features:
Oxford instr...
2015 FUSEI FMTM300-7HS-32P
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4 available
FMTM300-7HS-32P FUSEI_MENIX MOLD PRESS
Year of Manufacture2015 (x3) 2018 (x1)
Cond...
2005 AMAT AKT 1600 PECVD GEN 2 & 2.5
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AMAT AKT 1600
PECVD process iN , SiO2,
i a Si, SiON and N+ a Si
Process : PECVD iN,SiO2, i a S...