Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2008 1. Operating system: Win XP 200...

Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specifications: Electron Source – TF...

FEI Helios Nanolab 450 Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specification...

It is a single unit designed and produced by FEI. DESCRIPTION - Schottky FEG SEM - Works in hig...

- 50/60 Hz - 230V - Full load: 8A With: - Edwards RV 8 - Edwards PV 25 MK - FEI SE R 580 De...

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104

Fully Automated Correlative Fluorescence Light Microscope System

Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...

- Wafer Size: 300 - Category: Semiconductor Fabrication - Family: Metrology Equipment - Type: Foc...

FEI XL40 CROSS SECTION SEM WORKING CONDITION refurbished AVAILABLE IN WAREHOUSE