Type: Wafer Surface Analysis System

- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot

- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...

KLA-Tencor Spectra-Shape 8660 Semiconductor Fabrication Metrology Equipment CD Measurement System WAFER S...

KLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required 4...

Category: metrology Equipment: inspection Process: Wafer-Edge Inspection Wafer Size: 300mm

Installation date: 2016 Down date: 2020 Still installed in Clean room Problem discription: The...

2007 KLA-TENCOR VISEDGE_CV300 Wafer-Edge Inspection WAFER SIZE: 12

1995 KLA-TENCOR Opti-2600 Thickness Measurement WAFER SIZE: 8

1999 KLA-TENCOR UV1080 WAFER SIZE: 200mm

Profilometer - Date of Mfg: 4/92 - ±10 mm Scan Length - 2 to 250 µm/sec Scan Speed - 50/sec nomi...