RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces....

JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical ...

CHA SEC-1000 RAP Six Pocket Ebeam Gun, (2)Resistance Sources, 6kW Heater Array, 25.5" Bell Jar, ...

The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. ...

Modular Compact Rheometer with an air-bearing motor (highly accurate for sensitive samples for ob...

This machine is specifically designed to ensure that your markings meet every quality assurance r...

Operational in a fab

Polisher

RTP

DEP

E2 Mainframe, ALD Dep

WSIN + XLRW + OTS + TD, CU