Buy Equipment

Used 2011 FEI Titan cubed G2 60-300

Titan cubed G2 60-300 Electron Microscope Software Version 1.6.4 build 9698 Handler System NA ...

Used 2011 FEI Helios NanoLab 1200HP

Helios NanoLab 1200HP Failure Analysis

Refurbished FEI Helios Nanolab 450

Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specifications: Electron Source – TFE...

Used QUANTA 200 3D DualBeam

The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...

Refurbished 2009 FEI Helios Nanolab 400

Process Type: Wet Processing Date of Manufacture: 2009 Status of Equipment: Refurbished • Elst...

Used FEI Phenomworld G2Pro

FEI Phenomworld G2Pro Electron Microscope for sale complete unit, powered on, full range of spar...

Used 2016 FEI ExSolve CLM next Gen, 300mm

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104

Used 2015 FEI ExSolve CLM next Gen, 300mm

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

Used 2001 FEI DB235

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Date of Manufacture: 2001 Status of Equi...

Used FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System

Fully Automated Correlative Fluorescence Light Microscope System

Used 2012 FEI CLM+

Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...

Used FEI Dual Beam 835

This FEI Dual Beam 835 is equipped to take up to full 200mm wafers as well as chip pieces. Has a...