2011 FEI Titan cubed G2 60-300

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Used 2011 FEI Titan cubed G2 60-300
Titan cubed G2 60-300 Electron Microscope Software Version 1.6.4 build 9698 Handler System NA ...

2011 FEI Helios NanoLab 1200HP

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Used 2011 FEI Helios NanoLab 1200HP
Helios NanoLab 1200HP Failure Analysis

FEI Helios Nanolab 450

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Refurbished FEI Helios Nanolab 450
Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specifications: Electron Source – TFE...

FEI QUANTA 200 3D DualBeam FIB

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Used QUANTA  200 3D DualBeam
The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...

2009 FEI Helios Nanolab 400

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Refurbished 2009 FEI Helios Nanolab 400
Process Type: Wet Processing Date of Manufacture: 2009 Status of Equipment: Refurbished • Elst...

2014 FEI Phenom World G2Pro SEM Electron Microscope

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Used FEI  Phenomworld G2Pro
FEI Phenomworld G2Pro Electron Microscope for sale complete unit, powered on, full range of spar...

2016 FEI ExSolve CLM next Gen, 300mm

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Used 2016 FEI ExSolve CLM next Gen, 300mm
FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104

2015 FEI ExSolve CLM next Gen, 300mm

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Used 2015 FEI ExSolve CLM next Gen, 300mm
FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

2001 FEI DB235

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Used 2001 FEI DB235
Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Date of Manufacture: 2001 Status of Equi...

FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System

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Used FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System
Fully Automated Correlative Fluorescence Light Microscope System

2012 FEI CLM+

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Used 2012 FEI CLM+
Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...

FEI Dual Beam 835

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Used FEI Dual Beam 835
This FEI Dual Beam 835 is equipped to take up to full 200mm wafers as well as chip pieces. Has a...