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The product is a FEI Nova NanoSEM 600 unit manufactured in Czechia. It is a single unit designed ...

The FEI Nova NanoSEM 230, D9376 is a scanning electron microscope (SEM) unit manufactured in Czec...

- 50/60 Hz - 230V - Full load: 8A With: - Edwards RV 8 - Edwards PV 25 MK - FEI SE R 580 De...

Dual-Beam System: Combines high-resolution scanning electron microscope (SEM) and FIB capabilitie...

Type: SEM Wafer Size: Equipment Configuration: - 1-30 kV (500 volts possible); 50 volts possibl...

Status of Equipment: Refurbished • Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE d...

FEI Helios Nanolab 450 Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specification...

Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2002 Electron Column High-resolutio...

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104

Fully Automated Correlative Fluorescence Light Microscope System

Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...