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FEI FIB SEM Focused Ion Beam Scanning Electron Microscope
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Spare parts included - see pictures
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2009 FEI Helios Nanolab 400
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Status of Equipment: Refurbished • Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE d...
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FEI Helios 450S Dual Beam
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FEI Helios Nanolab 450 Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specification...
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2002 FEI Nova Nanolab 200 dual beam
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Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2002 Electron Column High-resolutio...
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2015 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103
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2016 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104
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FEI QUANTA 200 3D DualBeam FIB
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The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...
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FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System
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Fully Automated Correlative Fluorescence Light Microscope System
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2012 FEI CLM+
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Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...
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FEI XL40 Cross-section SEM
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FEI XL40 CROSS SECTION SEM WORKING CONDITION refurbished AVAILABLE IN WAREHOUSE
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