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FEI Nova NanoSEM 600
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The product is a FEI Nova NanoSEM 600 unit manufactured in Czechia. It is a single unit designed ...
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FEI Nova NanoSEM 230, with EDAX SDD EDS
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The FEI Nova NanoSEM 230, D9376 is a scanning electron microscope (SEM) unit manufactured in Czec...
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2013 FEI Quanta 450 SEM
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- 50/60 Hz - 230V - Full load: 8A With: - Edwards RV 8 - Edwards PV 25 MK - FEI SE R 580 De...
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2008 FEI QUANTA 3D FEG
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Dual-Beam System: Combines high-resolution scanning electron microscope (SEM) and FIB capabilitie...
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FEI Nova NanoSEM 450 SEM
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Type: SEM Wafer Size: Equipment Configuration: - 1-30 kV (500 volts possible); 50 volts possibl...
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2009 FEI Helios Nanolab 400
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Status of Equipment: Refurbished • Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE d...
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FEI Helios 450S Dual Beam
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FEI Helios Nanolab 450 Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specification...
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2002 FEI Nova Nanolab 200 dual beam
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Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2002 Electron Column High-resolutio...
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2015 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103
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2016 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104
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FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System
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Fully Automated Correlative Fluorescence Light Microscope System
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2012 FEI CLM+
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Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...
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