FEI Nova NanoSEM 600

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Used FEI Nova NanoSEM 600
The product is a FEI Nova NanoSEM 600 unit manufactured in Czechia. It is a single unit designed ...

FEI Nova NanoSEM 230, with EDAX SDD EDS

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Used FEI Nova NanoSEM 230, with EDAX SDD EDS
The FEI Nova NanoSEM 230, D9376 is a scanning electron microscope (SEM) unit manufactured in Czec...

2013 FEI Quanta 450 SEM

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Used 2013 FEI Quanta 450 SEM
- 50/60 Hz - 230V - Full load: 8A With: - Edwards RV 8 - Edwards PV 25 MK - FEI SE R 580 De...

2008 FEI QUANTA 3D FEG

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Used 2008 FEI QUANTA QUANTA 3D FEG
Dual-Beam System: Combines high-resolution scanning electron microscope (SEM) and FIB capabilitie...

FEI Nova NanoSEM 450 SEM

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Used FEI  Nova NanoSEM 450 SEM
Type: SEM Wafer Size: Equipment Configuration: - 1-30 kV (500 volts possible); 50 volts possibl...

2009 FEI Helios Nanolab 400

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Used 2009 FEI Helios Nanolab 400
Status of Equipment: Refurbished • Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE d...

FEI Helios 450S Dual Beam

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Used FEI Helios 450S Dual Beam
FEI Helios Nanolab 450 Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specification...

2002 FEI Nova Nanolab 200 dual beam

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Used 2002 FEI  Nova Nanolab 200 dual beam
Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2002 Electron Column High-resolutio...

2015 FEI ExSolve CLM next Gen, 300mm

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Used 2015 FEI ExSolve CLM next Gen, 300mm
FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

2016 FEI ExSolve CLM next Gen, 300mm

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Used 2016 FEI ExSolve CLM next Gen, 300mm
FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104

FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System

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Used FEI CorrSight Fully Automated Correlative Fluorescence Light Microscope System
Fully Automated Correlative Fluorescence Light Microscope System

2012 FEI CLM+

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Used 2012 FEI CLM+
Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...