Specifications Specification Unit DFP8140 Supported workpiece size - Φ4/5/6/8 inch(Select one s...

Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field...

Complete system except the HDD but if you want the HDD, it can be supplied with additional cost. ...

Warehoused It was in Working Condition before buying it. No EDX Vintage : 2000. It's complete...

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-300...

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...

Wafer size : 12 inch Resolution : ≦2nm Static measurement repeatability(3σ) : 0.6nm Dynamic me...

Metrology 8" Convergent ion-B device Offline

Still installed

2 available They are offline in the clean storages. As Is Vintage : S-9220 – 2001 for both too...