Metrology - Other Metrology for sale at Tara Semiconductor Technology

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Used NIKON INM20 inspection Microscope 200mm

LEICA INM20 Wafer Inspection Microscope · Bright/Darkfield Objective Lenses; Plan 5X, Plan Fluor...

Used 2001 INSTRON 5564

INSTRON, 5564 Pull Tester

Used 1995 Hitachi S-4500

As-is

Used Semiconductor Diagnostics SDI 210 210E-SPV, FAaST, Wafer Measurement

Used, looks complete, very clean

Used SARTORIUS LA310S

SARTORIUS, LA310S

Used Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer

Used, Selling As IS Angstrom SE200BM Spectroscopic Ellipsometer Angstrom AST-DHLS-60-9 ASTBenc...

Used THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage

Used, looks complete, very clean

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester

Used KLA AMI2900

KLA AMI2900, 300mm KLA Advanced Macro Inspection Module Tool ID: AMI2900

Used HSEB Axiospect 301

HSEB, Axiospect 301, Optical Microscope, 300mm Tool ID: OPI2900