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1995 Hitachi S-4500
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As-is
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Semiconductor Diagnostics SDI 210 210E-SPV, FAaST, Wafer Measurement
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Used, looks complete, very clean
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2005 SARTORIUS LA310S
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SARTORIUS, LA310S
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2001 INSTRON 5564
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INSTRON, 5564 Pull Tester
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Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer
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Used, Selling As IS Angstrom SE200BM Spectroscopic Ellipsometer Angstrom AST-DHLS-60-9 ASTBenc...
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THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage
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Used, looks complete, very clean
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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2011 KLA AMI2900
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KLA AMI2900, 300mm KLA Advanced Macro Inspection Module Tool ID: AMI2900
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HSEB Axiospect 301
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HSEB, Axiospect 301, Optical Microscope, 300mm Tool ID: OPI2900
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2015 FEI ExSolve CLM next Gen, 300mm
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FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103
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