Metrology - Other Metrology for sale at Tara Semiconductor Technolo...

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Used Hitachi S-6280H

AS IS

Used 2004 Bruker AXS, D8S - 2DB10

Bruker AXS, D8S - 2DB10, Tool ID: XRD300

Used 2001 KEITHLEY S475

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K273

Used 2001 KEITHLEY S475

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K268

Used 2001 KEITHLEY S475

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K264

Used HMI eP4 320

HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle Tool ID: SEI24000

Used KLA-Tencor P-1 Profiler

- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot

Used CMI XRX-X4 X-Ray System

System is Being Sold As-Is / Where-Is. Missing Computer & Software.

Used Zygo KMS 450i Mask Inspection tool

Used

Used ZEISS AIMS 193 Mask Qualification System w/Coherent LDU ESI 500Hz FT 193nm

Used, looks complete, very clean

Used Scientific Computing International SCI FilmTek 4000-A Multiple Layer Thickness Measurement Tool

Used, looks complete, very clean

Used Rudolph FE-3 Focus Ellipsometer, 4" 6" 8" capable

Used, looks complete, very clean