Metrology - Other Metrology for sale at Tara Semiconductor Technolo...

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Used 2015 FEI ExSolve CLM next Gen, 300mm

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

Used 2016 FEI ExSolve CLM next Gen, 300mm

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2104

Used 2001 KEITHLEY S475

KEITHLEY, S425, Kerf Parametric Tester

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester Tool ID: K259

Used 2001 KEITHLEY S475

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K270

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester Tool ID: K611X

Used Keithley S450

Keithley, S425, Kerf Parametric Tester

Used Keithley S425

Keithley, S425, Kerf Test, Keithley standard matrix kerf tester Tool ID: K255

Used Caltex Systems AMS-845xyz Microscope

as is

Used 2001 KEITHLEY S425

KEITHLEY, S425, Kerf Parametric Tester

Used TOPCON WM-2500

Used Nikon OPTIPHOT-300

12" WAFER AS IS