Hitachi S-4700-I w/EDX
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Status of Equipment: Crated
Specification:
Secondary electron image resolution: 2.1nm at 1kV
1...
2015 Hitachi Brightfield-Darkfield STEM detectors from Hitachi Regulus SU-8XXX
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Process Type: FA SEMs/TEMs/Dual Beams
Date of Manufacture: 2015
Status of Equipment: De-install...
2018 THERMOFISHER FEI Apreo C LoVac
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Process Type: FA SEMs/TEMs/Dual Beams
Date of Manufacture: 2018
Equipment Information:
Apreo C...
2008 DNS SU-3100
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Process Type: Wet Processing
Wafer Size: 300mm
Date of Manufacture: 2008
System Power Rating: ...
2008 ReVera/ VeraFlex VeraFlex
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Process Type: Metrology & Inspection
Wafer Size: 300mm
Date of Manufacture: 2008
Status of Equ...
2017 Modutek Wet Clean Wet Bench
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Process Type: Wet Bench
Date of Manufacture: 2017
Phosphoric Acid, detailed configuration attac...
Agilent N5181A MXG RF Analog Signal Generator
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Process Type: signal generator
Agilent 81160A Pulse Function Arbitrary Generator
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Process Type: Pulse Generator










