2007 Nanometrics Vertex Photoluminescence Measuring Device
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- Gratings:
150g-1250
300g-762
600g-400
- Detectors:
CCD (512 pixels)
InGaAs (256) pixels
- Laser...
Hitachi S-800 Scanning Electron Microscope
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Hitachi S-800 Scanning Electron Microscope, Anelva 956-7152, Daia DPF-4Z Parts
2000 NIKON NSR-2205EX14C
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200mm
Fab Section Lithography
Software Version MCSV E3.42, OCSV E3.42,
CIM SECS
Process Litho...
Hitachi S-4800 II Stage System
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▪ SPEC
. Windows 2000
. Cold FE type
. Type II stage system (fully motorized system)
. Vintag...












