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1995 Tokyo Electron Ltd. (TEL) CLEAN TRACK MARK 8 MULTI BLOCK
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Multi Block (Resist Coater/Developer) Resist Processing Equipment Date of Manufacture: 1995-12-...
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2006 Suss Microtec DSM200
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Wafer Inspection Equipment Metrology Equipment Date of Manufacture: 2006-12-31 Currently Confi...
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Rudolph Technologies, Inc. Waferscan 8000
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Macro-Defect Metrology Equipment Currently Configured for: 200mm
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NIKON 4S587-038 ADEXY Linear Motor Controller SPA225A NSR Series
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Model No: SPA225A ADEXY Electrical Diagram No: 4S587-038 Made in Japan This SPA225A is workin...
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2010 Semitool SRD N270
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-Vintage: 09/2010 -Type: N27-S-F-7-L8-WP-110-00000 -Voltage: 1x230VAC+N+PE 50Hz 13A max -Dimen...
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LAM Research TCP 9600SE
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Metal Etch Etch/Ash/Clean - Plasma Processing Currently Configured for: 200mm Software: Envisi...
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2018 LAM Research Alliance (A6) TCP 9400DSiE G
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Polysilicon Etch Etch/Ash/Clean - Plasma Processing Currently Configured for: 200mm Transport ...
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2014 LAM Research Alliance (A6) TCP 9400DFM
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Polysilicon Etch Etch/Ash/Clean - Plasma Processing Date of Manufacture: 2014-12-31 Currently ...
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Westbond 7367E
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2007 LAM Research Alliance (A6) TCP 9400DFM
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Polysilicon Etch Etch/Ash/Clean - Plasma Processing Date of Manufacture: 2007-12-31 Currently ...
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1998 KLA-Tencor KLA 2138
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Brightfield Inspection Metrology Equipment Date of Manufacture: 1998-05-01 Currently Configure...
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KLA-Tencor Corp. Prometrix UV-1050
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Film Thickness Measurement System Metrology Equipment Currently Configured for: 200mm Film Thi...
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