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NIKON Eclipse L200 inspection microscope with reflected light for wafer inspection
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Reflected light observation with brightfield and darkfield 5x/10x/20x/50x LU Plan BD objectives ...
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2019 TEL CLEAN TRACK LITHIUS Pro Z Inspection
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Wafer Inspection Equipment Metrology Equipment Date of Manufacture: 2019-01-01 Currently Confi...
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2010 TEL PROi
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300mm Cot / DEV
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2003 TEL Alpha-303i-K
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PYRO 12" As-is Furnace
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TEL 3880-200224-21 Printed Circuit Board
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TEL PCB, I/O TTLD24-11 F-DO32 PCB 3 available
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TEL RT-1000 Celsius with RCU
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RT-1000 Celsius with RCU, 1187-183655-16
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2017 EVG 6200 NT Mask Aligner
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EVG 6200 NT Mask Aligner
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2009 Phoenix Micromex SE160T
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300mm PHOENIX_X-Ray Systems
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Novellus 002-6640-11 Sabre Robot Arm
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Novellus Brooks Sabre Robot Arm
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Novellus MOD CNTRL
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02-116798-00, MOD CNTRL, P166/64 W/8COM 3 available
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Novellus 02-113639-00 MODULE CONTROLLER
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9 available
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Novellus LOADLOCK INDEXER SERVO METER, SERVO-ENCODER-01
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LOADLOCK INDEXER SERVO METER, SERVO-ENCODER-01
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