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2002 KLA-Tencor ASET-F5x
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- Manufactured in June, 2002 - Inspection Modes Include: - Dual Beam Spectrometry - Spectroscopic...
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2006 KLA-Tencor Archer 200 AIM
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KLA-TENCOR Archer 200 AIM Overlay Metrology Tool - ETAL Stage - Yaskawa Robot with NXC100 Contro...
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2011 LAM (Novellus) Vector Express AHM
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Size : 300mm(12") Vintage : 2011'Y Process Chamber : AHM X 1 Chamber * 2 FOUR Brooks Vision 9 ...
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2016 KLA-Tencor Aleris 8350
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KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports - Analysis of 190nm-...
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KLA-Tencor AIT Patterned Wafer Inspection Tool
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KLA-Tencor AIT Patterned Wafer Inspection Tool Cassette to Cassette YES
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2006 KLA-Tencor 2138XP
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KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes - For 150m...
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KLA Altair 8935i AOI Tool
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KLA Altair 8935i AOI Tool - For 150mm & 200mm Patterned & Unpatterned Wafers - For GaN & GaAs on...
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J.A. Woollam VB-200 Spectroscopic Ellipsometer
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J.A. Woollam VB-200 Spectroscopic Ellipsometer
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J.A. Woollam M-2000
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J.A. Woollam M-2000 Spectroscopic Ellipsometer
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GCA/Tropel 9000
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Surface Flatness Analyzer - Description Wafer Flatness Analyzer - Other Information - Fringe Sen...
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Frontier Semi 900TC-VAC
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Frontier 900TC-VAC Wafer Stress Gauge
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ASM MP-209 Mechanical Press System
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Installed in Fab Three Phase, Multiple Voltage Selection 4X8 TSOP Leadframe Tooling Se...
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