2002 Nikon Eclipse LV150NA + NWL200 TWB Microscope
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Still installed in a fab.
Working Condition.
Vintage - LV150NA : 2002, NWL200 TWB : 2013
They ...
Nikon Eclipse L200 + NWL860 TWB Microscope
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Warehoused Working Condition Vintage : Not Available. But it seems around 2015. It's complete.
2016 Delvotec G5/64000
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Including, 90° and 45° Bond Heads, Heated WH, Ebox. 2016 Refurbished, running condinition.
AMAT P-5000 Mark II MxP Poly
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Polysilicon Etch
Etch/Ash/Clean - Plasma Processing
Currently Configured for: 200mm
Current Eq...
2001 Rudolph Technologies, Inc. Vanguard SpectraLASER 200XL
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Film Thickness Measurement System
Metrology Equipment
Date of Manufacture: 2001-12-31
Currentl...
1997 Prometrix UV-1250SE
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Film Thickness Measurement System
Metrology Equipment
Date of Manufacture: 1997-12-31
Currentl...
Signatone S-M90
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Process Type: Wafer Probes
Status of Equipment: De-installed
Includes Signatone WL170 RF Manual...
2001 BTI BDF-41 Oxide
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Description OFEN23B Horizontal
Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm
...
2001 BTI OFEN22B BTI BDF- 41 Oxide
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BTI BDF- 41 Oxide
Description OFEN22B Horizontal
Wafer Size Range Minimum 150 mm Maximum 200 m...
Brooks EEPC Transponder RS232/Ethernet
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Brooks EEPC Transponder
frequency: 13.56MHz
TR5: 500mA (T)
Interface: 1200 Bd - 57600 Bd
Prot...