Further spec attached below Reticle Size □6′′ t=0.25′′ Surface 2 Layers Cr、3 Layers Cr, HT Pe...

Process Type: Metrology & Inspection Wafer Size: 300mm Date of Manufacture: 2008 Status of Equ...

Wafer Mounter with integrated delamination 300mm

8" The tool is like new and has no issues. Plug and play system. It is installed an running in c...

Single arm AMAT Mirra Mesa CMP SMIF robot 200mm Working condition

248nm (KrF) Scanner Lithography Equipment 300mm

Bruker Contour GTX Profiler 8x8 stage configuration. Instrument was on a full contract with Bru...

300mm Optical Review System Metrology Equipment

- 50/60 Hz - 210-240V - 15A

300mm Polysilicon Etch Etch/Ash/Clean - Plasma Processing

Detectors: SE, BSE, GSE, Chamber scope Stage: hot and cold (2) Scroll pumps

6 available PECVD (Chemical Vapor Deposition) Deposition Equipment 300mm