ASML Reticle Set

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Used ASML Reticle Set
Reticle Name Reticle Code BA-COMBI-4X 45440204D074 BA-RASTER 45560792P082 BA-SET-UP-IMAGIN 455...

2005 KOLB PS 04 AR CLEANING SYSTEM PCB cleaning

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Used 2005 KOLB PS 04 AR CLEANING SYSTEM PCB cleaning
kolb one-chamber cleaning system PS 04 AR cleaning of soldercarrier, assemblies, ESD boxes, PCB ...

1998 IWATSU ST-0505 Thickness meter

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Used 1998 IWATSU ST-0505 Thickness meter
The Iwatsu ST-0505 is a high-precision test instrument used primarily in the semiconductor and el...

Yield Engineering YES-450PB6 Polyimide Bake Oven

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Used Yield Engineering YES-450PB6 Polyimide Bake Oven
150mm Refurbished

Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers

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Used Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers
Xray Fluorescence Metrology Tool for up to 200mm Wafers

Philips PW-2830 XRF Wafer Analyzer

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Used Philips PW-2830 XRF Wafer Analyzer
PW 2830 is an x-ray system that is widely used in industrial applications to detect faults and de...

KLA-TENCOR Surfscan 6420

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Used KLA-TENCOR Surfscan 6420
Surface Inspection System

2012 ULVAC ENTRON-EX W300

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Used 2012 ULVAC ENTRON-EX W300
Vintage 2012 Wafer size: 300mm . Load Module - Load Port - Robot Arm . Transfer Module - Ro...

2015 BESI Datacon 2200 EVO

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Used 2015 BESI Datacon 2200 EVO

TSK Surfcom 590A Wafer surface measurement system

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Used TSK Surfcom 590A Wafer surface measurement system
TSK Surfcom 590A is a highly advanced wafer testing and metrology equipment used for the evaluati...

Olympus TH3 Inspection Microscope

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Used Olympus TH3 Inspection Microscope
Olympus TH3 Polish Inspection Microscope, w/ WHK10x/20L eyepieces; objectives (1ea): ULWD NeoSPla...

Beckman DU650i Spectrophotometer with monitor

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Used Beckman DU650i Spectrophotometer with monitor
Beckman UV/VIS-Spectrometer DU 650 series The DU® Series 650 Spectrophotometer is a microprocess...