KLA-Tencor DSW16E 300mm Calibration Wafer - Part Number 0210691-000 (Advanced Technology Develop...

- Manufactured in June, 2002 - Inspection Modes Include: - Dual Beam Spectrometry - Spectroscopic...

KLA-TENCOR Archer 200 AIM Overlay Metrology Tool - ETAL Stage - Yaskawa Robot with NXC100 Contro...

Size : 300mm(12") Vintage : 2011'Y Process Chamber : AHM X 1 Chamber * 2 FOUR Brooks Vision 9 ...

KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports - Analysis of 190nm-...

KLA-Tencor AIT Patterned Wafer Inspection Tool Cassette to Cassette YES

KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes - For 150m...

KLA Altair 8935i AOI Tool - For 150mm & 200mm Patterned & Unpatterned Wafers - For GaN & GaAs on...

Surface Flatness Analyzer - Description Wafer Flatness Analyzer - Other Information - Fringe Sen...

Frontier 900TC-VAC Wafer Stress Gauge

- Mercury Probe for Substrates from 5mm X 5mm to 200mm Wafers - Dose Monitoring for Silicon, Sili...

2 available 2ea Boom Stands Only