1998 IWATSU ST-0505 Thickness meter

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Used 1998 IWATSU ST-0505 Thickness meter
The Iwatsu ST-0505 is a high-precision test instrument used primarily in the semiconductor and el...

Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers

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Used Philips SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers
Xray Fluorescence Metrology Tool for up to 200mm Wafers

2012 ULVAC ENTRON-EX W300

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Used 2012 ULVAC ENTRON-EX W300
Vintage 2012 Wafer size: 300mm . Load Module - Load Port - Robot Arm . Transfer Module - Ro...

TSK Surfcom 590A Wafer surface measurement system

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Used TSK Surfcom 590A Wafer surface measurement system
TSK Surfcom 590A is a highly advanced wafer testing and metrology equipment used for the evaluati...

Olympus TH3 Inspection Microscope

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Used Olympus TH3 Inspection Microscope
Olympus TH3 Polish Inspection Microscope, w/ WHK10x/20L eyepieces; objectives (1ea): ULWD NeoSPla...

Beckman DU650i Spectrophotometer with monitor

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Used Beckman DU650i Spectrophotometer with monitor
Beckman UV/VIS-Spectrometer DU 650 series The DU® Series 650 Spectrophotometer is a microprocess...

Multi Dessicator

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Used Multi Dessicator
A Multi Desiccator is a device used for storing and preserving moisture-sensitive materials. It t...

DESPATCH LCC1-87N-2

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Used DESPATCH LCC1-87N-2
Special Features The removable HEPA (High Efficiency Particulate Air) filter is designed to prov...

HITACHI SU-70

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Used HITACHI SU-70
Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...

EVG 620

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Used EVG 620
BSA 350W lamp 2, 4, & 6 in substrate with 5 & 7 inch mask holder. Fully operational.

JEOL JWS-7555 scanning electron microscope

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Used JEOL JWS-7555 scanning electron microscope
JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical ...

1997 RUDOLPH FE-VII-SD

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Used 1997 RUDOLPH FE-VII-SD
The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. ...