New Metrology and Defect inspection New Installed

Metrology and Defect inspection New Installed

(Back Side Etch – comparable to SEZ 203) (looks new)

150 / 200 mm single port

(configurable for 200 or 300mm) (dark Field)

Four Dimensions 280I Automatic Four Point Probe Meter 120V, 60Hz. Includes PC & monitor. 20in...

LAM Rainbow TCP 9600SE II standalone with DSQ - Plasma Etch Vintage: 2005+/-5j Wafersize: 150mm...

Reticle Name Reticle Code BA-COMBI-4X 45440204D074 BA-RASTER 45560792P082 BA-SET-UP-IMAGIN 455...

kolb one-chamber cleaning system PS 04 AR cleaning of soldercarrier, assemblies, ESD boxes, PCB ...

The Iwatsu ST-0505 is a high-precision test instrument used primarily in the semiconductor and el...

Xray Fluorescence Metrology Tool for up to 200mm Wafers

Vintage 2012 Wafer size: 300mm . Load Module - Load Port - Robot Arm . Transfer Module - Ro...