TSK Surfcom 590A is a highly advanced wafer testing and metrology equipment used for the evaluati...

Olympus TH3 Polish Inspection Microscope, w/ WHK10x/20L eyepieces; objectives (1ea): ULWD NeoSPla...

Beckman UV/VIS-Spectrometer DU 650 series The DU® Series 650 Spectrophotometer is a microprocess...

A Multi Desiccator is a device used for storing and preserving moisture-sensitive materials. It t...

Special Features The removable HEPA (High Efficiency Particulate Air) filter is designed to prov...

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...

BSA 350W lamp 2, 4, & 6 in substrate with 5 & 7 inch mask holder. Fully operational.

JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical ...

The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. ...

This machine is specifically designed to ensure that your markings meet every quality assurance r...

Operational in a fab

Polisher