Type : FIB (Focused ION Beam) Process : Metrology (Defect Review) Function : SEM, ION Milling ...

The following options are included/available on this equipment: → Wire Management System WM2 → ...

Condition: “As is” Date of manufacture: Refurbished in 2011 including dual monitor upgrade ​Waf...

Description probe: Flying Probe Tester Vintage 2022

2 available 8" As-is 1x HIGH TEMP OXIDE 1x UNDOPED-POLY

Running. It’s in Working Condition but selling As Is. It is complete and HDD & Software Include...

3 available BRUKER D8 Fabline, 300mm Bruker D8 Fabline X-Ray Diffractometer 2011 2014 2015

Bruker D8 DaVinci X-Ray Diffractometer 2013

Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specifications: Electron Source – TF...

Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2008 1. Operating system: Win XP 200...

BRAND NEW Brookfield Ametek DV2TRVT medium viscosity viscometer with RV spindle set, temperature ...

Furnace